Phase error compensation for three-dimensional shape measurement with projector defocusing

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Date: June 10, 2011
From: Applied Optics(Vol. 50, Issue 17)
Publisher: Optical Society of America
Document Type: Author abstract; Report
Length: 156 words

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Abstract :

This paper analyzes the phase error for a three-dimensional (3D) shape measurement system that utilizes our recently proposed projector defocusing technique. This technique generates seemingly sinusoidal structured patterns by defocusing binary structured patterns and then uses these patterns to perform 3D shape measurement by fringe analysis. However, significant errors may still exist if an object is within a certain depth range, where the defocused fringe patterns retain binary structure. In this research, we experimentally studied a large depth range of defocused fringe patterns, from near-binary to near-sinusoidal, and analyzed the associated phase errors. We established a mathematical phase error function in terms of the wrapped phase and the depth z. Finally, we calibrated and used the mathematical function to compensate for the phase error at arbitrary depth ranges within the calibration volume. Experimental results will be presented to demonstrate the success of this proposed technique. [c] 2011 Optical Society of America OCIS codes: 120.0120, 120.2650, 120.5050.

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Gale Document Number: GALE|A261729305